AN222: Resistance Measurements of Small-Scale and Microscopic Material Samples and Components Using the TEGAM Model 1740

AN222: Resistance Measurements of Small-Scale and Microscopic Material Samples and Components Using the TEGAM Model 1740

GENEVA, OH, October 10, 2015

This application note describes a measurement system developed by TEGAM and a customer to make high-accuracy, four-wire milliohm measurements of small-scale or microscopic components and material samples utilizing the TEGAM 1740 microohmeter and a specialized test setup.

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