The combination of the TEGAM 4040A Differential Amplifier and National Instruments 5122 Digitizer/Oscilloscope creates the widest range measurement system possible in a 3U PXI format.
4040A+5122: Expanded Digitizer Range
This Application Note is intended to help individuals who are not power amplifier experts to understand the basic parameters such as Gain, Bandwidth (BW), Slew Rate (SR), Total Harmonic Distortion (THD), Input Impedance and Current Limit necessary to properly select an amplifier for use in testing and experimentation.
The purpose of this application note is to provide a summary of the synchronizing outputs of TEGAM’s arbitrary waveform generators (AWGs), and to offer a quick-start guide for their operation and use.
The purpose of this application note is to provide an understanding of the basic differences between True and DDS Arbitrary Waveform Generators. With AWGs, there are two fundamental design variations: DDS (Direct Digital Synthesis) and True (Traditional) Arbitrary Waveform Generators. Each design variation has its own unique advantages and disadvantages. Because the application determines instrument selection, an understanding of the basic differences between True and DDS AWGs is highly beneficial.
AN401: True vs. DDS Arbitrary Waveform Generators
This application note describes how a customer used the TEGAM Model 2350 Dual Channel, High-Voltage amplifier to make a MEMS optical profiling system more effective, and how he applied the system to test and study the reliability of MEMS devices.
AN402: MEMS Optical Profiler
Polyphase signal generation is required for a broad range of test applications. For example, it is used in condition monitoring or fault detection systems. These tests require the simulation of three-phase sine waves with line frequencies, ranging from 50 – 800 Hz, where fault conditions or high frequency noise are introduced. Three-phase AC power supplies may be considered; however, they are restricted by bandwidth limitations, cost and the inability to recreate real-world waveforms. TEGAM’s 2700A series arbitrary/function generators address the synchronization, phase shift and resolution issues and are ideal for simulating pulse, noise, sensor stimuli, speed profiles or faults.
Describes a station assembled for the North Dakota State College of Science that stimulates MEMS devices and optically measures their response.
AN404: MEMS Training Station
Making an accurate measurement requires an unbroken chain of signal integrity from the point of connection through the conversion to a numerical value. Application note 502 explains the benefits a differential amplifier provides in a measurement system.
AN502: Differential Amplifier Measurements
A differential instrumentation amplifier is an essential and versatile tool for use in various tests and experiments. For convenience, TEGAM offers a complete package that includes a 4040A instrumentation amplifier, LabVIEW control software and a PXI-1033 chassis.
AN503: 4040A Stand Alone Instrumentation Amplifier
The TEGAM Model 4040A expands the measurement range of PXI digitizers and scopes from 2 mV to 100 V. Although this range appears fairly wide, there are some applications which require a wider range. The measurement range of a PXI system can be expanded up to 1200 Vpk by combining a TEGAM 4040A with x10 or x100 probes.
An interesting note helping engineers make PSRR measurements cost-effectively while simplifying the measurement process and reducing set up time.